Title :
Gallium-Arsenide diffused diodes
Author :
Halpern, Joel ; Lowen, J. ; Rediker, R.H.
Author_Institution :
Massachusetts Institute of Technology, Lincoln Lab., Lexington, Mass.
fDate :
4/1/1960 12:00:00 AM
Keywords :
Atomic measurements; Contacts; Cutoff frequency; Diodes; Electric variables; Electrical resistance measurement; Electron beams; Etching; Fabrication; Gallium arsenide; Geometry; Germanium; Gold; Pollution measurement; Semiconductor diodes; Switches; Zinc;
Journal_Title :
Electron Devices, IRE Transactions on
DOI :
10.1109/T-ED.1960.14612