Title :
Electrochemical technology of silicon surface-alloyed diffused transistors
Author :
Sikina, Thomas V
fDate :
4/1/1960 12:00:00 AM
Keywords :
Cutoff frequency; Diodes; Electrical resistance measurement; Etching; Gallium arsenide; Geometry; Germanium; Gold; Pollution measurement; Semiconductor diodes; Silicon; Solid state circuits; Switches;
Journal_Title :
Electron Devices, IRE Transactions on
DOI :
10.1109/T-ED.1960.14614
