Title :
Improved barrier-grid storage tube
Author_Institution :
ITT Labs., Fort Wayne, Ind.
fDate :
4/1/1960 12:00:00 AM
Keywords :
Area measurement; Assembly; Coaxial components; Cutoff frequency; Dielectrics; Diodes; Displays; Electrical resistance measurement; Electroluminescent devices; Electron beams; Etching; Geometry; Germanium; Gold; Magnetic switching; Pollution measurement; Silicon; Switches; Voltage; Writing;
Journal_Title :
Electron Devices, IRE Transactions on
DOI :
10.1109/T-ED.1960.14615