DocumentCode :
1015252
Title :
Scalar calibration of quasi-optical reflection measurements
Author :
Koers, Gaetan ; Stiens, Johan ; Vounckx, Roger
Author_Institution :
Lab. for Micro- & Opto-Electron., Vrije Univ., Brussels, Belgium
Volume :
54
Issue :
7
fYear :
2006
fDate :
7/1/2006 12:00:00 AM
Firstpage :
3121
Lastpage :
3126
Abstract :
For accurate calibrated measurements, calibration procedures tend to rely on the acquisition of vector data by means of heterodyning or multiport power measurements. In this paper, we propose a novel scalar one-port calibration method for quasi-optical frequency response measurements. Only uncalibrated reference and reflected power detectors are needed for accurate results within specified error bounds. Calibration is based on a modified match-short-short procedure, and scalar reflection of the sample is calculated from two measurement points per frequency. The effectiveness of the method is illustrated with two experimental cases measured over the full W-band.
Keywords :
calibration; electromagnetic wave reflection; microwave reflectometry; optical variables measurement; calibrated measurements; match-short-short procedure; quasi-optical frequency; quasi-optical reflection measurement; quasi-optics; reflected power detectors; scalar calibration; scalar one-port calibration; scalar reflection; un-calibrated reference; Calibration; Dielectric loss measurement; Dielectric measurements; Frequency measurement; Frequency response; Microwave measurements; Optical reflection; Permittivity measurement; Power measurement; Slabs; Calibration; millimeter; quasi-optics; reflection measurement;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.2006.877049
Filename :
1650454
Link To Document :
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