DocumentCode :
1015268
Title :
Deembedding and unterminating microwave fixtures with the genetic algorithm
Author :
Adalev, Alexei S. ; Korovkin, Nikolay V. ; Hayakawa, Masashi ; Nitsch, Jürgen B.
Author_Institution :
Dept. of Electron. Eng., Univ. of Electro-Commun., Tokyo, Japan
Volume :
54
Issue :
7
fYear :
2006
fDate :
7/1/2006 12:00:00 AM
Firstpage :
3131
Lastpage :
3140
Abstract :
A new method of deembedding a test fixture effect from the data of microwave measurements is presented in this paper. It is shown that the traditional unterminating problem (the problem of finding fixture characteristics) being posed in a finite frequency range may be reduced to a problem of fitting the characteristics of the "thru" experiment. The latter is proposed to be solved by using the genetic algorithm (GA). A special trick is suggested to take fixture power loss into consideration, which is sometimes necessary to increase the goodness of fitting the characteristics. Physically correct constraints for optimization variables and optimal parameters of the GA are discussed in this paper. The method is applicable for all microwave fixtures, except for those whose characteristics are influenced by the relative position of the adapters comprising the fixture. The method does not have any specific frequency limitation and does not require any calibration standards. The results of the experiments performed have validated a high efficiency of the method proposed, and confirm that the accuracy of a deembedding problem solution is close to the goodness of fitting data of the "thru" experiment.
Keywords :
genetic algorithms; microwave measurement; millimetre wave measurement; fixture characteristics; fixture power loss; genetic algorithm; microwave fixtures; microwave measurement data; microwave network analyzer; scattering-parameter measurement; test fixture effect deembedding; unterminating problem; Calibration; Constraint optimization; Fixtures; Frequency estimation; Genetic algorithms; Microwave measurements; Microwave theory and techniques; Standards development; Surface-mount technology; Testing; Calibration; deembedding; genetic algorithm (GA); microwave network analyzer (NA); scattering-parameter measurement; test fixture;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.2006.877063
Filename :
1650456
Link To Document :
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