• DocumentCode
    1015352
  • Title

    On the theoretical determination of the alignment sensitivity of electric and magnetic devices

  • Author

    Schaefer, C.H.

  • Author_Institution
    IBM T. J. Watson Research Center, Yorktown Heights, New York. USA
  • Volume
    21
  • Issue
    6
  • fYear
    1985
  • fDate
    11/1/1985 12:00:00 AM
  • Firstpage
    2181
  • Lastpage
    2184
  • Abstract
    In the computer design of electric and magnetic devices, when the fields can be derived from a scalar potential satisfying the Laplace equation, integral equation methods are powerful tools, particularly in 3-d problems. A certain Fredholm integral equation of the first kind, used first to obtain the potential, may be utilized a second time with a different right-hand side to obtain directly the rate of change in potential due to a change in the position of an electrode or magnet pole-piece. The new right-hand side of the integral equation is formulated in simple terms. Knowledge of this rate of change suggests itself to two types of applications: alignment sensitivity study and improved numerical optimization of electromagnetic devices.
  • Keywords
    Electrostatic analysis; Fredholm integral equations; Magnetic analysis; Sensitivity analysis/optimization; Apertures; Electrodes; Electromagnetic devices; Electron optics; Electrostatics; Integral equations; Laplace equations; Magnetic devices; Optical distortion; Optical sensors;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1985.1064255
  • Filename
    1064255