DocumentCode :
1015371
Title :
Noise in diffused transistors
Author :
Hanson, G.H.
Author_Institution :
Bell Telephone Labs., Inc., Allentown, Pa.
Volume :
7
Issue :
2
fYear :
1960
fDate :
4/1/1960 12:00:00 AM
Firstpage :
115
Lastpage :
115
Keywords :
Bandwidth; Circuit noise; Coupling circuits; Frequency; Gain; Germanium; Life testing; Noise figure; Noise measurement; Power amplifiers; Silicon; Stability; Switching circuits; Telephony; Waveguide discontinuities;
fLanguage :
English
Journal_Title :
Electron Devices, IRE Transactions on
Publisher :
ieee
ISSN :
0096-2430
Type :
jour
DOI :
10.1109/T-ED.1960.14656
Filename :
1472763
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1015371
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