DocumentCode
1015519
Title
Thermal simulation of transients in microwave devices
Author
Webb, P.W. ; Russell, I.A.D.
Author_Institution
Sch. of Electron. & Electr. Eng., Birmingham Univ., UK
Volume
138
Issue
3
fYear
1991
fDate
6/1/1991 12:00:00 AM
Firstpage
329
Lastpage
334
Abstract
The optimal design of solid state microwave power devices, taking thermal and electrical parameters into consideration is a complex subject requiring extensive use of numerical simulation tools. The authors address the problem of the thermal simulation of pulsed microwave solid state power sources designed to operate at a particular duty cycle. The electrical design dictates that the device be as small as possible, in conflict with the thermal criteria. The size of the device will increase with increasing duty cycle and the length of each power pulse it is required to handle. A significant factor is the amount of computing resource necessary to simulate the thermal transient for a sufficiently large number of duty cycles so that the device will reach its maximum working temperature. A solution to this problem is presented that requires the combination of one steady state, and one transient simulation, to predict the maximum working temperature for a given duty cycle and any pulse length. A particular hetero-junction bipolar transistor (HBT) operated under varying duty cycle is analysed as an example
Keywords
Schottky gate field effect transistors; heterojunction bipolar transistors; power transistors; semiconductor device models; simulation; solid-state microwave devices; thermal analysis; transients; 3D model; HBT; MESFET; duty cycle; electrical parameters; hetero-junction bipolar transistor; maximum working temperature; microwave devices; optimal design; pulse length; pulsed microwave sources; solid state power devices; thermal simulation; transients;
fLanguage
English
Journal_Title
Circuits, Devices and Systems, IEE Proceedings G
Publisher
iet
ISSN
0956-3768
Type
jour
Filename
258022
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