• DocumentCode
    1015519
  • Title

    Thermal simulation of transients in microwave devices

  • Author

    Webb, P.W. ; Russell, I.A.D.

  • Author_Institution
    Sch. of Electron. & Electr. Eng., Birmingham Univ., UK
  • Volume
    138
  • Issue
    3
  • fYear
    1991
  • fDate
    6/1/1991 12:00:00 AM
  • Firstpage
    329
  • Lastpage
    334
  • Abstract
    The optimal design of solid state microwave power devices, taking thermal and electrical parameters into consideration is a complex subject requiring extensive use of numerical simulation tools. The authors address the problem of the thermal simulation of pulsed microwave solid state power sources designed to operate at a particular duty cycle. The electrical design dictates that the device be as small as possible, in conflict with the thermal criteria. The size of the device will increase with increasing duty cycle and the length of each power pulse it is required to handle. A significant factor is the amount of computing resource necessary to simulate the thermal transient for a sufficiently large number of duty cycles so that the device will reach its maximum working temperature. A solution to this problem is presented that requires the combination of one steady state, and one transient simulation, to predict the maximum working temperature for a given duty cycle and any pulse length. A particular hetero-junction bipolar transistor (HBT) operated under varying duty cycle is analysed as an example
  • Keywords
    Schottky gate field effect transistors; heterojunction bipolar transistors; power transistors; semiconductor device models; simulation; solid-state microwave devices; thermal analysis; transients; 3D model; HBT; MESFET; duty cycle; electrical parameters; hetero-junction bipolar transistor; maximum working temperature; microwave devices; optimal design; pulse length; pulsed microwave sources; solid state power devices; thermal simulation; transients;
  • fLanguage
    English
  • Journal_Title
    Circuits, Devices and Systems, IEE Proceedings G
  • Publisher
    iet
  • ISSN
    0956-3768
  • Type

    jour

  • Filename
    258022