DocumentCode :
1015555
Title :
Spin Transfer Magnetization Switching Read/Write Cycle Test in MgO-Based Magnetic Tunnel Junctions
Author :
Lee, J.M. ; Ye, L.X. ; Weng, M.C. ; Chen, Y.C. ; Li, Simon C. ; Su, J.P. ; Wu, Te-Ho
Author_Institution :
Nat. Yunlin Univ. of Sci. &Technol., Touliu
Volume :
43
Issue :
7
fYear :
2007
fDate :
7/1/2007 12:00:00 AM
Firstpage :
3349
Lastpage :
3353
Abstract :
We present the results of spin transfer torque magnetization switching results for some MgO-based magnetic tunnel junctions (MTJ) with tunneling magnetoresistance (TMR) ratios of 38.6% to 200% and critical current densities of 1.032 times 107 A/cm2 down to 1.68 times 106 A/cm2. We observed 2.2 times 104 stable read/write (R/W) cycles before failure under the spin transfer torque magnetization switching. The synchronized variations in both high and low magnetoresistance (MR) over the stable R/W cycles indicate that magnetization reversal into either high or low state occurs in parallel. We made a stability analysis for high and low MR distribution matching to a normalized fraction of stable cycles.
Keywords :
magnetisation reversal; spin dynamics; tunnelling magnetoresistance; MgO - Binary; TMR; magnetic tunnel junction; magnetization reversal; read/write cycle test; spin transfer magnetization switching; spin transfer torque magnetization switching; synchronized variation; tunneling magnetoresistance; Electrical resistance measurement; Magnetic switching; Magnetic tunneling; Magnetization; Polarization; Pulse measurements; Stability analysis; Testing; Torque; Tunneling magnetoresistance; MRAM; MTJ; MgO; TMR; read/write cycle; spin transfer torque; stability analysis;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.2007.899146
Filename :
4252298
Link To Document :
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