DocumentCode
1015585
Title
Transient operation of transistor with inductive load
Author
Lin, H.C. ; Hlavacek, A.R. ; White, B.H.
Author_Institution
Westinghouse Electric Corp., Pittsburgh, Pa.
Volume
7
Issue
3
fYear
1960
fDate
7/1/1960 12:00:00 AM
Firstpage
174
Lastpage
178
Abstract
A transistor operating with an inductive load may develop a collector-emitter short circuit when the transistor is suddenly turned off. The secondary breakdown of the collector characteristics determines the susceptibility to this type of failure. The secondary breakdown is greatly influenced by the reverse base current. The reverse base bias voltage and impedance affect the reverse base current in a predictable manner. The failure mechanism can be explained in terms of the characteristics of a four-layer device. Transistor requirements and design considerations are examined. For safe operation, the secondary breakdown current should be greater than the maximum operating current. When the reverse base current is minimized, the transistor is also protected. Several circuits which prevent the flow of reverse base current are presented.
Keywords
Circuits; Electric breakdown; Electrical resistance measurement; Electron devices; Failure analysis; Impedance; Inductance; Knee; Power transistors; Protection; Semiconductor device breakdown; Temperature; Variable speed drives; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IRE Transactions on
Publisher
ieee
ISSN
0096-2430
Type
jour
DOI
10.1109/T-ED.1960.14676
Filename
1472783
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