• DocumentCode
    1015585
  • Title

    Transient operation of transistor with inductive load

  • Author

    Lin, H.C. ; Hlavacek, A.R. ; White, B.H.

  • Author_Institution
    Westinghouse Electric Corp., Pittsburgh, Pa.
  • Volume
    7
  • Issue
    3
  • fYear
    1960
  • fDate
    7/1/1960 12:00:00 AM
  • Firstpage
    174
  • Lastpage
    178
  • Abstract
    A transistor operating with an inductive load may develop a collector-emitter short circuit when the transistor is suddenly turned off. The secondary breakdown of the collector characteristics determines the susceptibility to this type of failure. The secondary breakdown is greatly influenced by the reverse base current. The reverse base bias voltage and impedance affect the reverse base current in a predictable manner. The failure mechanism can be explained in terms of the characteristics of a four-layer device. Transistor requirements and design considerations are examined. For safe operation, the secondary breakdown current should be greater than the maximum operating current. When the reverse base current is minimized, the transistor is also protected. Several circuits which prevent the flow of reverse base current are presented.
  • Keywords
    Circuits; Electric breakdown; Electrical resistance measurement; Electron devices; Failure analysis; Impedance; Inductance; Knee; Power transistors; Protection; Semiconductor device breakdown; Temperature; Variable speed drives; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IRE Transactions on
  • Publisher
    ieee
  • ISSN
    0096-2430
  • Type

    jour

  • DOI
    10.1109/T-ED.1960.14676
  • Filename
    1472783