• DocumentCode
    1015654
  • Title

    Simulation of cold-test parameters and RF output power for a coupled-cavity traveling-wave tube

  • Author

    Wilson, Jeffrey D. ; Kory, Carol L.

  • Author_Institution
    NASA Lewis Res. Center, Cleveland, OH, USA
  • Volume
    42
  • Issue
    11
  • fYear
    1995
  • fDate
    11/1/1995 12:00:00 AM
  • Firstpage
    2015
  • Lastpage
    2020
  • Abstract
    Procedures have been developed which enable the accurate computation of the cold-test (absence of an electron beam) parameters and RF output power for the slow-wave circuits of coupled-cavity traveling-wave tubes (TWT´s). The cold-test parameters, which consist of RF phase shift per cavity, impedance, and attenuation, are computed with the three-dimensional electromagnetic simulation code MAFIA and compared to experimental data for an existing V-band (59-64 GHz) coupled-cavity TWT. When simulated in cylindrical coordinates, the absolute average differences from experiment are only 0.3% for phase shift and 2.4% for impedance. Using the cold-test parameters calculated with MAFIA as input, the NASA Coupled-Cavity TWT Code is used to simulate the saturated RF output power of the TWT across the V-band frequency range. Taking into account the output window and coupler loss, the agreement with experiment is very good from 60-64 GHz, with the average absolute percentage difference between simulated and measured power only 3.8%. This demonstrates that the saturated RF output power of a coupled cavity TWT can be accurately simulated using cold-test parameters determined with a three dimensional electromagnetic simulation code
  • Keywords
    simulation; slow wave structures; travelling wave tubes; 59 to 64 GHz; MAFIA code; NASA code; RF output power; V-band; attenuation; cold-test parameters; coupled-cavity traveling-wave tube; impedance; phase shift; simulation; slow-wave circuits; three-dimensional electromagnetic simulation; Circuit simulation; Computational modeling; Coupling circuits; Electromagnetic coupling; Electron beams; Electron tubes; Impedance; Optical coupling; Power generation; Radio frequency;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.469412
  • Filename
    469412