• DocumentCode
    1015722
  • Title

    Avalanche breakdown voltages of diffused silicon and germanium diodes

  • Author

    Root, C.D. ; Lieb, D.P. ; Jackson, B.

  • Author_Institution
    Raytheon Manufacturing Co., Newton, Mass.
  • Volume
    7
  • Issue
    4
  • fYear
    1960
  • Firstpage
    257
  • Lastpage
    262
  • Abstract
    Avalanche breakdown is defined in terms of the diode´s electrical characteristics as well as the internal physical processes. Using the latter definition, and the basic diffusion equation, breakdown voltage is rigorously computed for various diffused junctions. The calculation process is described and similarities to both linear and abrupt junctions are pointed out. Graphs are presented showing breakdown voltage as a function of diffusion parameters for both germanium and silicon. Intermediate charts used in the calculations are shown also. These give maximum electric field in junction and normalized breakdown voltage for families of diffusions.
  • Keywords
    Avalanche breakdown; Breakdown voltage; Charge carrier processes; Diodes; Electric breakdown; Equations; Germanium; Ionization; P-n junctions; Semiconductor diodes; Silicon; Space charge;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IRE Transactions on
  • Publisher
    ieee
  • ISSN
    0096-2430
  • Type

    jour

  • DOI
    10.1109/T-ED.1960.14690
  • Filename
    1472796