DocumentCode
1016381
Title
A method for the rapid evaluation of semiconductor device reliability
Author
Howard, B.T. ; Dodson, G.A.
Author_Institution
Bell Telephone Labs., Inc., Murray Hill, N.J.
Volume
8
Issue
2
fYear
1961
fDate
3/1/1961 12:00:00 AM
Firstpage
178
Lastpage
178
Keywords
Acceleration; Boron; Coatings; Fabrication; Gallium arsenide; Guns; Lenses; Semiconductor device reliability; Semiconductor diodes; Shape; Shape measurement; Silicon; Stress; Temperature; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IRE Transactions on
Publisher
ieee
ISSN
0096-2430
Type
jour
DOI
10.1109/T-ED.1961.14756
Filename
1472919
Link To Document