Title : 
An Analytical Compact Circuit Model for Nanowire FET
         
        
            Author : 
Paul, Bipul C. ; Tu, Ryan ; Fujita, Shinobu ; Okajima, Masaki ; Lee, Thomas H. ; Nishi, Yoshio
         
        
            Author_Institution : 
Stanford Univ., Stanford
         
        
        
        
        
            fDate : 
7/1/2007 12:00:00 AM
         
        
        
        
            Abstract : 
In this paper, we propose a quasi-analytical device model of nanowire FET (NWFET) for both ballistic and drift-diffusion current transport, which can be used in any conventional circuit simulator like SPICE. The closed form expressions for current-voltage (I-V) and capacitance-voltage characteristics are obtained by analytically solving device equations with appropriate approximations. The developed model was further verified with the measured I-V characteristics of an NWFET device. Results show a close match of the model with measured data.
         
        
            Keywords : 
ballistic transport; diffusion; field effect transistors; nanowires; semiconductor device models; analytical compact circuit model; ballistic transport; capacitance-voltage characteristic; current-voltage characteristic; drift-diffusion current transport; nanowire FET; quasi-analytical device model; Analytical models; Ballistic transport; Capacitance-voltage characteristics; Circuit analysis; Circuit simulation; Equations; FETs; MOSFETs; Nanoscale devices; SPICE; Ballistic transport; compact model; drift-diffusion transport; nanowire FET (NWFET);
         
        
        
            Journal_Title : 
Electron Devices, IEEE Transactions on
         
        
        
        
        
            DOI : 
10.1109/TED.2007.899397