DocumentCode :
1016474
Title :
Magnetic properties and structures of sputtered CoNi/Cr films
Author :
Yamaguchi, Hitoshi ; Yanagisawa, Masahiro
Author_Institution :
NEC Corporation, Kawasaki, Japan
Volume :
22
Issue :
5
fYear :
1986
fDate :
9/1/1986 12:00:00 AM
Firstpage :
576
Lastpage :
578
Abstract :
This paper describes microstructures and crystalline structures of sputtered CoNi films on sputtered Cr underlayers (CoNi/Cr) and sputtered CoNi films on polyimide (CoNi/pol) relating to magnetic properties at all over the composition range (0-100 at% Ni) determined by transmission electron microscopy (TEM) observation. Magnetic properties of CoNi/Cr and CoNi/pol were studied as a function of Ni content. The maximum Hc value for CoNi/Cr was obtained at about 36 at.% Ni content. Hc values for CoNi/pol were low (below 100 Oe) for all the compositions. CoNi/Cr microstructures were composed of island-like grains (-100 nm) with smaller (-10 nm) sub-grains over all the composition range. On the other hand, no island-like grains were observed in CoNi/pol. Crystalline structures were determined by electron diffraction, wherein CoNi/Cr and CoNi/pol were composed of hexagonal close packed (HCP) phase, a mixture of HCP and faced-centered cubic (FCC) phase, or FCC phase depending on Ni content. Especially, Co64Ni36/Cr, where the maximum Hc was observed, was composed of a mixture of HCP and FCC. The high Hc on CoNi/Cr was relating to microstructures and crystalline structures.
Keywords :
Magnetic recording; Chromium; Crystal microstructure; Crystallization; Diffraction; FCC; Magnetic films; Magnetic force microscopy; Magnetic properties; Polyimides; Transmission electron microscopy;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.1986.1064352
Filename :
1064352
Link To Document :
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