• DocumentCode
    1016756
  • Title

    Approximation of the electron emission integral [semiconductor devices]

  • Author

    Pimbley, J.M.

  • Author_Institution
    Dept. of Math. Sci., Rensselaer Polytech. Inst., Troy, NY, USA
  • Volume
    35
  • Issue
    9
  • fYear
    1988
  • fDate
    9/1/1988 12:00:00 AM
  • Firstpage
    1551
  • Lastpage
    1553
  • Abstract
    Recent research has focused on the mathematical formulation of charge-carrier emission over energy barriers in semiconductor devices. The description of this process includes an improper integral that cannot be evaluated explicitly. Approximate representations based on the Gauss-Laguerre quadrature are proposed for high accuracy over the physical range of interest. These approximations are formulated and their accuracy quantified
  • Keywords
    electron emission; function approximation; integral equations; semiconductor device models; Gauss-Laguerre quadrature; approximations; charge-carrier emission; electron emission integral; energy barriers; improper integral; semiconductor devices; Charge carrier processes; Charge carriers; Electron emission; Energy barrier; FETs; Gaussian approximation; MOSFET circuits; Physics; Semiconductor devices; Silicon;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.2589
  • Filename
    2589