DocumentCode :
1016756
Title :
Approximation of the electron emission integral [semiconductor devices]
Author :
Pimbley, J.M.
Author_Institution :
Dept. of Math. Sci., Rensselaer Polytech. Inst., Troy, NY, USA
Volume :
35
Issue :
9
fYear :
1988
fDate :
9/1/1988 12:00:00 AM
Firstpage :
1551
Lastpage :
1553
Abstract :
Recent research has focused on the mathematical formulation of charge-carrier emission over energy barriers in semiconductor devices. The description of this process includes an improper integral that cannot be evaluated explicitly. Approximate representations based on the Gauss-Laguerre quadrature are proposed for high accuracy over the physical range of interest. These approximations are formulated and their accuracy quantified
Keywords :
electron emission; function approximation; integral equations; semiconductor device models; Gauss-Laguerre quadrature; approximations; charge-carrier emission; electron emission integral; energy barriers; improper integral; semiconductor devices; Charge carrier processes; Charge carriers; Electron emission; Energy barrier; FETs; Gaussian approximation; MOSFET circuits; Physics; Semiconductor devices; Silicon;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.2589
Filename :
2589
Link To Document :
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