Title :
Skew measurements in clock distribution circuits using an analytic signal method
Author :
Yamaguchi, Takahiro J. ; Soma, Mani ; Nissen, James P. ; Halter, David E. ; Raina, Rajesh ; Ishida, Masahiro
Author_Institution :
Advantest Labs. Ltd., Miyagi, Japan
fDate :
7/1/2004 12:00:00 AM
Abstract :
This paper presents the application of a new analytic signal method for measuring several different kinds of clock skew in the clock distribution network of microprocessors. First, key terms are defined, and other existing skew measurement methods are reviewed. Then, detailed steps are given for applying the new method for measuring skew between a master and distributed clocks, between two distributed clocks, and between different frequency clocks that are related by frequency division. An indirect procedure for measuring deterministic clock skew is also proposed. Next, the new method is validated with experimental data from a prototype microprocessor test. Performance comparison is performed between the analytic signal method and the two-probe method. Finally, the measurement requirements of the proposed analytic signal method are compared with those of conventional methods.
Keywords :
clocks; microprocessor chips; time measurement; timing jitter; PICA; analytic signal method; analytic signal theory; clock distribution circuits; clock distribution network; deterministic clock skew; frequency division; microprocessors; random clock skew; skew measurements; two-probe measurement; Circuit analysis; Clocks; Delay; Frequency conversion; Frequency measurement; Microprocessors; Prototypes; Registers; Signal analysis; Testing; Analytic signal theory; PICA; clock distribution network; clock skew; deterministic clock skew; frequency division; random clock skew; two-probe measurement;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCAD.2004.829814
