DocumentCode
1017172
Title
Simple structured PMOSFET fabricated using molecular layer doping
Author
Nishizawa, Jun-ichi ; Aoki, Kenji ; Akamine, Tadao
Author_Institution
Res. Inst. of Electr. Commun., Tohoku Univ., Katahira Sendai, Japan
Volume
11
Issue
3
fYear
1990
fDate
3/1/1990 12:00:00 AM
Firstpage
105
Lastpage
106
Abstract
The application of molecular layer doping (MLD) to the formation of shallow source and drain regions of a PMOSFET is discussed. The MLD process consists of three steps. First, the natural oxide on the Si surface is removed by thermal cleaning to expose an active Si surface. Second, a boron adsorbed layer is formed on the Si surface. Third, boron atoms undergo solid-phase diffusion from the adsorbed layer into the bulk. The electrical characteristics of the PMOSFET in the short-channel region are superior to those of devices fabricated by conventional techniques.<>
Keywords
diffusion in solids; insulated gate field effect transistors; semiconductor doping; PMOSFET; adsorbed layer; drain regions; molecular layer doping; shallow source; solid-phase diffusion; thermal cleaning; Annealing; Atomic layer deposition; Boron; Chemicals; Cleaning; Doping; Fabrication; Ion implantation; MOSFET circuits; Solids;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/55.46948
Filename
46948
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