• DocumentCode
    1017172
  • Title

    Simple structured PMOSFET fabricated using molecular layer doping

  • Author

    Nishizawa, Jun-ichi ; Aoki, Kenji ; Akamine, Tadao

  • Author_Institution
    Res. Inst. of Electr. Commun., Tohoku Univ., Katahira Sendai, Japan
  • Volume
    11
  • Issue
    3
  • fYear
    1990
  • fDate
    3/1/1990 12:00:00 AM
  • Firstpage
    105
  • Lastpage
    106
  • Abstract
    The application of molecular layer doping (MLD) to the formation of shallow source and drain regions of a PMOSFET is discussed. The MLD process consists of three steps. First, the natural oxide on the Si surface is removed by thermal cleaning to expose an active Si surface. Second, a boron adsorbed layer is formed on the Si surface. Third, boron atoms undergo solid-phase diffusion from the adsorbed layer into the bulk. The electrical characteristics of the PMOSFET in the short-channel region are superior to those of devices fabricated by conventional techniques.<>
  • Keywords
    diffusion in solids; insulated gate field effect transistors; semiconductor doping; PMOSFET; adsorbed layer; drain regions; molecular layer doping; shallow source; solid-phase diffusion; thermal cleaning; Annealing; Atomic layer deposition; Boron; Chemicals; Cleaning; Doping; Fabrication; Ion implantation; MOSFET circuits; Solids;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/55.46948
  • Filename
    46948