DocumentCode
1017183
Title
Mapping semiconductor-device internal voltages as an aid to device design and for understanding device anomalies
Author
Sawyer, D.E.
Author_Institution
IBM Corp., Poughkeepsie, N. Y.
Volume
8
Issue
5
fYear
1961
Firstpage
424
Lastpage
424
Keywords
Circuits; Current density; Data systems; Electron emission; Gallium arsenide; Germanium; Ice; P-i-n diodes; Probability distribution; Protection; Pulse modulation; Semiconductor diodes; Silicon; Surface treatment; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IRE Transactions on
Publisher
ieee
ISSN
0096-2430
Type
jour
DOI
10.1109/T-ED.1961.14836
Filename
1472999
Link To Document