Title :
Design concepts for some special four-layer diodes
Author :
Hubner, K. ; Yamada, Makoto
Author_Institution :
Shockley Transistor, Palo Alto, Calif.
Keywords :
Breakdown voltage; Charge carrier processes; Contracts; Current measurement; Diodes; Electrodes; Energy measurement; Geometry; Impurities; P-n junctions; Pins; Protection; Silicon alloys; Switches; Temperature; Testing; Voltage;
Journal_Title :
Electron Devices, IRE Transactions on
DOI :
10.1109/T-ED.1961.14838
