DocumentCode
1017219
Title
Low-current behavior of silicon transistors
Author
Iwersen, J.E. ; Bray, A.R.
Author_Institution
Bell Telephone Labs., Inc., Murray Hill, N.J.
Volume
8
Issue
5
fYear
1961
Firstpage
425
Lastpage
425
Keywords
Breakdown voltage; Current measurement; Diodes; Electrodes; Energy measurement; Geometry; Impurities; P-n junctions; Pins; Protection; Silicon; Silicon alloys; Switches; Telephony; Temperature; Testing; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IRE Transactions on
Publisher
ieee
ISSN
0096-2430
Type
jour
DOI
10.1109/T-ED.1961.14839
Filename
1473002
Link To Document