• DocumentCode
    1017261
  • Title

    Diffraction by an arbitrary subreflector: GTD solution

  • Author

    Lee, Shung-wu ; Cramer, Paul, Jr. ; Woo, Kenneth ; Rahmat-Samii, Yahya

  • Author_Institution
    Dept. of Electrical Eng., Univ. of Illinois, Urbana, IL, USA
  • Volume
    27
  • Issue
    3
  • fYear
    1979
  • fDate
    5/1/1979 12:00:00 AM
  • Firstpage
    305
  • Lastpage
    316
  • Abstract
    The high-frequency asymptotic solution of diffraction by a conducting subreflector is studied. By using Keller\´s geometrical theory of diffraction and the newly developed uniform asymptotic theory of diffraction, the scattered field is determined up to an including terms of order k^{-1/2} relative to the incident field. The key feature of the present work is that the surface of the subreflector is completely arbitrary. In fact, it is only necessary to specify the surface at a set of discrete points over a random net. Our computer program will fit those points by cubic spline functions and calculate the necessary geometrical parameters of the subreflector. In a companion paper by Y. Rahmat-Samii, R. Mittra, and V. Galindo-Israel, the scattered field from the submflector is used to calculate the secondary pattern of an arbitrarily shaped reflector by a series expansion method. Thus, in these two papers, it is hoped that we have developed a "universal" computer program that can analyze most dual-reflector antennas currently conceivable. It should also be added that our method of calculation is extremely numerically efficient. In many cases, it is one order of magnitude faster than the conventional integration method based on physical optics.
  • Keywords
    Geometrical diffraction theory; Reflector antennas, multireflector; Convolution; Hydrogen; Optical scattering; Optical surface waves; Physical optics; Physical theory of diffraction; Radar antennas; Radar scattering; Spline; Surface fitting;
  • fLanguage
    English
  • Journal_Title
    Antennas and Propagation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-926X
  • Type

    jour

  • DOI
    10.1109/TAP.1979.1142096
  • Filename
    1142096