Title :
"Hump" current dependence upon trapping effects and the relationship to some aspects of the forward-injection failure of GaAs tunnel diodes
Author :
Selig, T. ; Smith, Johan
Keywords :
Conducting materials; Degradation; Forward contracts; Gallium arsenide; Gold; Impurities; Magnetic devices; Magnetic materials; Magnetic semiconductors; Magnetic separation; Marine vehicles; Semiconductor diodes; Semiconductor materials; Temperature dependence; Tunneling;
Journal_Title :
Electron Devices, IRE Transactions on
DOI :
10.1109/T-ED.1961.14846
