• DocumentCode
    1017287
  • Title

    "Hump" current dependence upon trapping effects and the relationship to some aspects of the forward-injection failure of GaAs tunnel diodes

  • Author

    Selig, T. ; Smith, Johan

  • Volume
    8
  • Issue
    5
  • fYear
    1961
  • Firstpage
    427
  • Lastpage
    428
  • Keywords
    Conducting materials; Degradation; Forward contracts; Gallium arsenide; Gold; Impurities; Magnetic devices; Magnetic materials; Magnetic semiconductors; Magnetic separation; Marine vehicles; Semiconductor diodes; Semiconductor materials; Temperature dependence; Tunneling;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IRE Transactions on
  • Publisher
    ieee
  • ISSN
    0096-2430
  • Type

    jour

  • DOI
    10.1109/T-ED.1961.14846
  • Filename
    1473009