DocumentCode :
1017374
Title :
Complimentary single-electron/hole action of nanoscale SOI CMOS transistors
Author :
Zhang, Yaohui ; Baron, Filipp A. ; Wang, Kang L. ; Krivokapic, Zoran
Author_Institution :
Dept. of Electr. Eng., Univ. of California, Los Angeles, CA, USA
Volume :
25
Issue :
7
fYear :
2004
fDate :
7/1/2004 12:00:00 AM
Firstpage :
492
Lastpage :
494
Abstract :
We propose a new device structure for room-temperature single-electron/hole transistors based on nanosize narrow-width fully depleted silicon-on-insulator (SOI) CMOS transistors. The floating body of SOI MOSFETs can become a Coulomb island, whose single charging energy is more than 30 meV, as the gate length and width of MOSFETs is less than 10 nm. As SOI MOSFETs are biased at accumulation, single-electron, or hole tunnels, are sent, one by one, from the source to the floating body and then to the drain via Zener tunneling process. N-channel SOI MOSFETs can have the functions of single-electron transistors (n-SETs) while p-channel MOSFETs can have the functions of single-hole transistors (p-SETs). SOI MOSFETs still behave as typical MOSFETs when biased at inversion. There is a gate voltage margin of 0.9 V to separate Coulomb blockade oscillations from CMOS normal operation.
Keywords :
CMOS integrated circuits; Coulomb blockade; MOSFET; silicon-on-insulator; single electron transistors; tunnelling; 0.9 V; CMOS normal operation; Coulomb blockade oscillations; Coulomb island; MOSFET width; N-channel SOI MOSFET; Zener tunneling process; charging energy; complimentary single-electron/hole action; floating body; fully depleted transistors; gate length; gate voltage; hole tunnels; nanoscale SOI CMOS transistors; nanosize narrow-width transistors; p-channel MOSFET; single-electron hole transistors; single-electron transistor; Application specific integrated circuits; CMOS process; CMOS technology; MOSFETs; Nanoscale devices; Physics; Silicon; Single electron transistors; Temperature; Tunneling; Band-to-band; CMOS; SET; single-electron transistor; tunneling;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2004.830281
Filename :
1308430
Link To Document :
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