DocumentCode
1017381
Title
A localized trace element analysis of water trees in XLPE cable insulation by micro-PIXE and EDX
Author
Hinrichsen, P.F. ; Houdayer, A. ; Belhadfa, A. ; Crine, J.-P. ; Pelissou, S. ; Cholewa, M.
Author_Institution
Lab. de Phys. Nucl., Montreal Univ., Que., Canada
Volume
23
Issue
6
fYear
1988
Firstpage
971
Lastpage
978
Abstract
PIXE (proton-induced X-ray emission) with a focused proton beam of 30-or 220- mu m diameter and EDX (energy dispersive X-ray analysis) of water-trees in XLPE HV (cross-linked polyethylene high-voltage) cable insulation. The merits of these two methods are compared and discussed. It is shown that water-trees are more contaminated than the surrounding insulation. On a localized basis the impurity content of the untreed insulation varies considerably within a few square millimeters.<>
Keywords
cable insulation; electric breakdown of solids; organic insulating materials; polymers; EDX; HV; PIXE; XLPE cable insulation; cross-linked polyethylene; energy dispersive X-ray analysis; impurity content; localized trace element analysis; proton-induced X-ray emission; untreed insulation; water trees; Cable insulation; Cables; Degradation; Dispersion; Electrons; Impurities; Particle beams; Protons; Testing; Trees - insulation;
fLanguage
English
Journal_Title
Electrical Insulation, IEEE Transactions on
Publisher
ieee
ISSN
0018-9367
Type
jour
DOI
10.1109/14.16522
Filename
16522
Link To Document