• DocumentCode
    1017542
  • Title

    Optimization of thermal interface materials for electronics cooling applications

  • Author

    Singhal, Vishal ; Siegmund, Thomas ; Garimella, Suresh V.

  • Author_Institution
    Sch. of Mech. Eng., Purdue Univ., West Lafayette, IN, USA
  • Volume
    27
  • Issue
    2
  • fYear
    2004
  • fDate
    6/1/2004 12:00:00 AM
  • Firstpage
    244
  • Lastpage
    252
  • Abstract
    Thermal interface materials (TIMs) are used in electronics cooling applications to decrease the thermal contact resistance between surfaces in contact. A methodology to determine the optimal volume fraction of filler particles in TIMs for minimizing the thermal contact resistance is presented. The method uses finite element analysis to solve the coupled thermo-mechanical problem. It is shown that there exists an optimal filler volume fraction which depends not only on the distribution of the filler particles in a TIM but also on the thickness of the TIM layer, the contact pressure and the shape and the size of the filler particles. A contact resistance alleviation factor is defined to quantify the effect of these parameters on the contact conductance with the use of TIMs. For the filler and matrix materials considered-platelet-shaped boron nitride filler particles in a silicone matrix-the maximum observed enhancement in contact conductance with the use of TIMs was by a factor of as much as nine.
  • Keywords
    contact resistance; cooling; electronics packaging; finite element analysis; mechanical contact; optimisation; thermal conductivity; BN; Si; contact resistance alleviation; contact resistance reduction; coupled thermo-mechanical problem; electronics cooling; filler particles; finite element analysis; optimal volume fraction; thermal contact conductance; thermal contact resistance; thermal interface materials; Conducting materials; Contact resistance; Electronics cooling; Finite element methods; Rough surfaces; Shape; Surface resistance; Surface roughness; Thermal conductivity; Thermal resistance; Contact resistance reduction; electronics cooling; finite element analysis; interface materials; thermal contact conductance;
  • fLanguage
    English
  • Journal_Title
    Components and Packaging Technologies, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3331
  • Type

    jour

  • DOI
    10.1109/TCAPT.2004.828587
  • Filename
    1308444