DocumentCode :
1017566
Title :
Electron-beam defocusing due to high-intensity RF fields
Author :
Brewer, G.R. ; Anderson, J.R.
Author_Institution :
Hughes Research Labs., Malibu, Calif.
Volume :
8
Issue :
6
fYear :
1961
Firstpage :
528
Lastpage :
539
Abstract :
The electric fields associated with a "slow" electro-magnetic wave propagating along an electron beam will modulate this beam; the axial component of field will produce the usual "bunching," while the radial component will cause periodic perturbations in the radius of such an electron beam. This paper presents the results of analytical and experimental studies in an attempt to explain certain features of this defocusing effect of intense RF fields on the beam in a traveling-wave tube. In particular the effect of cathode flux on the RF defocusing of a beam in Brillouin flow is treated.
Keywords :
Cathodes; Circuit noise; Electromagnetic scattering; Electron beams; Electron tubes; Magnetic analysis; Magnetic flux; Magnetic modulators; Optical modulation; P-n junctions; Radio frequency; Saturation magnetization; Semiconductor device noise; Semiconductor diodes;
fLanguage :
English
Journal_Title :
Electron Devices, IRE Transactions on
Publisher :
ieee
ISSN :
0096-2430
Type :
jour
DOI :
10.1109/T-ED.1961.14873
Filename :
1473036
Link To Document :
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