Title :
Improved transmission-line attenuators for integrated power filters in the RF band
Author :
Campbell, Colin Kydd ; Van Wyk, Jacobus Daniel ; Wolmarans, Pieter
Author_Institution :
Center for Power Electron. Syst., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
fDate :
6/1/2004 12:00:00 AM
Abstract :
Differential mode electromagnetic interference (EMI) at radio frequencies (RF) in compact integrated power electronic converter modules-as due in part to semiconductor switching and structural electromagnetic coupling-can be suppressed by the use of lossy transmission line lowpass filters. A previously reported lowpass filter design for such a system employed a Cu-Al2O3-Ni-BaTiO3-Ni-Al2O3-Cu lossy uniform width planar transmission line. where the low-permittivity Al2O3 ceramic wafer merely separates the Cu and Ni conductors. The higher-conductivity Cu conductors served to handle kW-level power frequencies. Above power frequencies, skin-depth restrictions cause current diversion from the Cu line into the inner segment of Ni-BaTiO3-Ni that provides subsequent attenuation of milliwatt-level spurious RF interference. Velocity reduction due to the high-permittivity barium titanate (BaTiO3) ceramic (εr∼12,000) enabled compact integrated package size construction (e.g., 10 mm ×1.5 mm ×130 mm). With the aim of increasing the lowpass cutoff response slope, the current paper examines a prototype non-uniform (in width) planar Ni-BaTiO3-Ni constituent attenuator segment. For ease of one-dimensional (1-D) ABCD matrix analysis, a four-section Ni-BaTiO3-Ni planar attenuator-comprised of four cascaded uniform sections of decreasing step width-was fabricated as a first approximation to an exponential taper. While good agreement was obtained between the predicted and experimental responses of the reverse-connected (narrow-to-wide) attenuator up to about 30 MHz, the discrepancy between the experimental and theoretical forward-connected (wide-to-narrow) frequency responses is attributed here to three-dimensional current constrictions at step interfaces. It is postulated that this can be overcome by the alternate use of a linearly- or an exponentially-tapered line.
Keywords :
attenuators; conductors (electric); copper; electromagnetic coupling; matrix algebra; power convertors; power filters; radiofrequency interference; semiconductor switches; transmission lines; Cu-Al2O3-Ni-BaTiO3-Ni-Al2O3-Cu; RF band; cutoff response slope; electromagnetic interference; exponentially-tapered line; frequency responses; integrated package size construction; integrated power filters; linearly-tapered line; lossy transmission line; low-permittivity ceramic wafer; lowpass filters; matrix analysis; power electronic converter; power frequencies; radio frequencies; reverse-connected attenuator; semiconductor switching; skin-depth restrictions; step interfaces; structural electromagnetic coupling; transmission-line attenuators; velocity reduction; Attenuators; Ceramics; Conductors; Electromagnetic coupling; Electromagnetic interference; Planar transmission lines; Power filters; Propagation losses; Radio frequency; Transmission lines; Cu conductors; EMI; RF; differential mode electromagnetic interference; exponentially-tapered line; linearly-tapered line; lowpass filter; planar attenuator; radio frequencies; reverse-connected attenuator;
Journal_Title :
Components and Packaging Technologies, IEEE Transactions on
DOI :
10.1109/TCAPT.2004.828569