Title :
1/f phase noise in quartz s.a.w. devices
Author_Institution :
Raytheon Research Division, Waltham, USA
Abstract :
It has been observed that s.a.w. delay lines made on ST-cut quartz are the major source of 1/f noise in s.a.w. controlled oscillators. However, with proper treatment of the quartz surface, the 1/f noise can be significantly reduced. A modified expression for calculating the single-sideband f.m. noise power spectrum of s.a.w. oscillators is presented.
Keywords :
electron device noise; oscillators; quartz; random noise; surface acoustic wave devices; ultrasonic delay lines; 1/f phase noise; SAW controlled oscillators; SAW delay lines; SSB FM noise power spectrum; ST-cut quartz; quartz SAW devices; surface treatment;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19790211
