DocumentCode
1017975
Title
Room temperature c.w. operation of InGaAsP/InP heterostructure lasers emitting at 1.56 μm
Author
Akiba, Shigeyuki ; Sakai, Kenji ; Matsushima, Y. ; Yamamoto, Takayuki
Author_Institution
KDD Research & Development Laboratories, Tokyo, Japan
Volume
15
Issue
19
fYear
1979
Firstpage
606
Lastpage
607
Abstract
Room-temperature c.w. operation of InGaAsP/InP heterostructure lasers grown by liquid-phase epitaxy was achieved at 1.56 μm. An active InGaAsP layer was essentially sandwiched by InP, though a thin InGaAsP buffer layer was deposited to prevent the melt-back of the active layer. Threshold current was typically 300 mA for a 17 μm wide oxide-defined stripe laser.
Keywords
III-V semiconductors; gallium arsenide; indium compounds; optical communication equipment; semiconductor junction lasers; CW operation; InGaAsP/InP heterostructure lasers; liquid phase epitaxial growth; melt back; optical communication equipment; semiconductor function lasers; silical fibres;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19790435
Filename
4256043
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