Title :
Semiconductor delay line tuner
Author_Institution :
Electro-Optical Systems, Inc., Pasedena, Calif.
Keywords :
Boundary conditions; Charge carrier density; Delay lines; Diffusion processes; Frequency; Frequency measurement; Frequency response; Germanium; Impedance; Impedance measurement; Inductance; Performance analysis; Propagation delay; Pulse measurements; Silicon; Solid state circuits; Tuners; Voltage;
Journal_Title :
Electron Devices, IRE Transactions on
DOI :
10.1109/T-ED.1962.14912