DocumentCode
1018069
Title
Emittance growth of high-energy electrons produced from the laser wakefield acceleration
Author
Suk, H. ; Hafz, N.A.M. ; Lee, H.J. ; Kim, J.
Author_Institution
Center for Adv. Accel., Korea Electrotechnol. Res. Inst., Changwon, South Korea
Volume
32
Issue
2
fYear
2004
fDate
4/1/2004 12:00:00 AM
Firstpage
429
Lastpage
432
Abstract
When a laser wake field passes a sharp downward plasma density transition, a significant amount of plasma electrons are trapped and accelerated to relativistic high energies over a distance of the plasma wavelength. Phase space area of the plasma electrons remains constant during acceleration in the ion channel, but it was found that the phase space area, which is related with emittance, increases rapidly by the nonlinear space-charge field when the electron beam moves out of the plasma. As a result, the emittance of the accelerated electron beam grows severely during propagation in free space, and ultimately this limits the beam intensity. The emittance growth problem is investigated with two-dimensional particle-in-cell simulations, and several methods are suggested to suppress such a rapid emittance growth.
Keywords
electron beam focusing; plasma accelerators; plasma light propagation; plasma simulation; relativistic plasmas; wakefield accelerators; beam intensity; electron beam; free space propagation; high-energy electrons production; ion channel; laser wakefield acceleration; nonlinear space-charge field; phase space area; plasma electrons trapping; plasma wavelengths; rapid emittance growth; sharp downward plasma density transition; two-dimensional particle-in-cell simulations; Acceleration; Electron beams; Electron emission; Electron traps; Laser transitions; Particle beams; Plasma accelerators; Plasma density; Plasma simulation; Plasma waves; Advanced accelerator; electron beam; emittance; plasma; self-trapping;
fLanguage
English
Journal_Title
Plasma Science, IEEE Transactions on
Publisher
ieee
ISSN
0093-3813
Type
jour
DOI
10.1109/TPS.2004.826360
Filename
1308488
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