Title :
Broad aspects of the interaction in parametric devices
Author :
Evans, H.J. ; Hsu, Hua-Chih
Author_Institution :
General Electric Company, Syracuse, N. Y.
Keywords :
Capacitance; Circuit noise; Conductivity; Electrical resistance measurement; Electromagnetic scattering; Fabrication; Geometry; Packaging; Phonons; Photonic crystals; Semiconductor device noise; Semiconductor diodes; Semiconductor materials; Varactors;
Journal_Title :
Electron Devices, IRE Transactions on
DOI :
10.1109/T-ED.1962.14928
