DocumentCode :
1018315
Title :
Kerr enhancement by SiO and AlN films sputtered on plastic substrates
Author :
Niihara, Toshio ; Ohta, Morio ; Kaneko, Katsuhiro ; Sugita, Yutaka ; Horigome, S.
Author_Institution :
Hitachi Ltd., Kokubunji, Tokyo, Japan
Volume :
22
Issue :
5
fYear :
1986
fDate :
9/1/1986 12:00:00 AM
Firstpage :
1215
Lastpage :
1217
Abstract :
It has been found that there is a remarkable difference of Kerr enhancement effect between films sputtered on glass and on plastics. SiO film does not show so clear enhancement on plastics while it does on glass. Dependence of Kerr rotation angle Θk on SiO film thickness was compared with calculated Θk for different values of refractive index n, and the decrease of n was found on plastics. Also surface roughness was observed on plastics. On the other hand, AlN film shows fairly well enhancement even on plastics as well as on glass. There is no decrease of n, and smoother surface was observed. To obtain enough enhancement, many factors should be optimized.
Keywords :
Magnetooptic Kerr effect; Magnetooptic memories; Dielectric films; Dielectric substrates; Glass; Optical films; Plastic films; Refractive index; Rough surfaces; Sputtering; Surface fitting; Surface roughness;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.1986.1064511
Filename :
1064511
Link To Document :
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