• DocumentCode
    1018315
  • Title

    Kerr enhancement by SiO and AlN films sputtered on plastic substrates

  • Author

    Niihara, Toshio ; Ohta, Morio ; Kaneko, Katsuhiro ; Sugita, Yutaka ; Horigome, S.

  • Author_Institution
    Hitachi Ltd., Kokubunji, Tokyo, Japan
  • Volume
    22
  • Issue
    5
  • fYear
    1986
  • fDate
    9/1/1986 12:00:00 AM
  • Firstpage
    1215
  • Lastpage
    1217
  • Abstract
    It has been found that there is a remarkable difference of Kerr enhancement effect between films sputtered on glass and on plastics. SiO film does not show so clear enhancement on plastics while it does on glass. Dependence of Kerr rotation angle Θk on SiO film thickness was compared with calculated Θk for different values of refractive index n, and the decrease of n was found on plastics. Also surface roughness was observed on plastics. On the other hand, AlN film shows fairly well enhancement even on plastics as well as on glass. There is no decrease of n, and smoother surface was observed. To obtain enough enhancement, many factors should be optimized.
  • Keywords
    Magnetooptic Kerr effect; Magnetooptic memories; Dielectric films; Dielectric substrates; Glass; Optical films; Plastic films; Refractive index; Rough surfaces; Sputtering; Surface fitting; Surface roughness;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1986.1064511
  • Filename
    1064511