DocumentCode
1018315
Title
Kerr enhancement by SiO and AlN films sputtered on plastic substrates
Author
Niihara, Toshio ; Ohta, Morio ; Kaneko, Katsuhiro ; Sugita, Yutaka ; Horigome, S.
Author_Institution
Hitachi Ltd., Kokubunji, Tokyo, Japan
Volume
22
Issue
5
fYear
1986
fDate
9/1/1986 12:00:00 AM
Firstpage
1215
Lastpage
1217
Abstract
It has been found that there is a remarkable difference of Kerr enhancement effect between films sputtered on glass and on plastics. SiO film does not show so clear enhancement on plastics while it does on glass. Dependence of Kerr rotation angle Θk on SiO film thickness was compared with calculated Θk for different values of refractive index n, and the decrease of n was found on plastics. Also surface roughness was observed on plastics. On the other hand, AlN film shows fairly well enhancement even on plastics as well as on glass. There is no decrease of n, and smoother surface was observed. To obtain enough enhancement, many factors should be optimized.
Keywords
Magnetooptic Kerr effect; Magnetooptic memories; Dielectric films; Dielectric substrates; Glass; Optical films; Plastic films; Refractive index; Rough surfaces; Sputtering; Surface fitting; Surface roughness;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.1986.1064511
Filename
1064511
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