• DocumentCode
    1018350
  • Title

    Recombination in gallium phosphide via a deep state associated with nickel

  • Author

    Peaker, A.R. ; Brunwin, R.F. ; Jordon, P. ; Hamilton, Blaine

  • Author_Institution
    University of Manchester Institute of Science & Technology, Manchester, UK
  • Volume
    15
  • Issue
    20
  • fYear
    1979
  • Firstpage
    663
  • Lastpage
    664
  • Abstract
    The properties of nickel in gallium phosphide are discussed in terms of its behaviour as a recombination centre. Although it possesses a large minority-carrier cross-section and is present in v.p.e. material in quite large concentrations, it is found to have a very low majority-carrier cross-section so that the recombination rate saturates at low excitation densities. Thus the centre is unlikely to be of importance in the recombination process in normal l.e.d. structures.
  • Keywords
    III-V semiconductors; deep levels; electron-hole recombination; gallium compounds; nickel; GaP; LED structures; Ni recombination centre; deep state; electron hole recombination; excitation densities; majority carrier cross section; minority carrier cross section;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19790471
  • Filename
    4256088