Title :
Ray tracing on the electron optical bench
Author_Institution :
Westinghouse Electric Corp., Pittsburgh, Pa.
Keywords :
Electron beams; Electron optics; Electrostatic measurements; Electrostatics; Frequency; Glass; Lenses; Optical design; Optical distortion; Phase detection; Plasma measurements; Plasma temperature; Ray tracing; Testing; Vacuum systems;
Journal_Title :
Electron Devices, IRE Transactions on
DOI :
10.1109/T-ED.1962.14955
