Title :
Ray interpretation of the material signature in the acoustic microscope
Author :
Parmon, W. ; Bertoni, Henry L.
Author_Institution :
Polytechnic Institute of New York, Brooklyn, USA
Abstract :
The output voltage of the reflection acoustic microscope depends on the location on the object surface in a way that is characteristic of its elastic properties. We present a ray model showing that this dependence is due to interference between a narrow bundle of axial rays and rays associated with the leaky Rayleigh wave excited on the surface.
Keywords :
Rayleigh waves; acoustic microscopes; axial rays; characteristic; elastic properties; interference; leaky Rayleigh wave; material signature; output voltage; ray interpretation; ray model; reflection acoustic microscope;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19790486
