Title :
Moire´ Patterns and Two-Dimensional Aliasing in Line Scanner Data Acquisition Systems
Author :
McGillem, C.D. ; Riemer, T.E.
Author_Institution :
Laboratory for Application of Remote Sensing Purdue University W. Lafayette, Indiana
Abstract :
The basic mechanism underlying the generation of Moire´ patterns in line scanner data acquisition systems is examined. A general expression is developed in terms of typical system parameters for the reproduced image of such systems and the interaction of the image spectrum; the raster frequency and digital sampling frequency of the A/D conversion process are discussed and examples given. System design requirements for avoiding Moire´ pattern generation and two-dimensional aliasing are discussed.
Keywords :
Aircraft; Data acquisition; Frequency conversion; Image converters; Image sampling; Low pass filters; Optical frequency conversion; Remote sensing; Signal processing; Signal sampling;
Journal_Title :
Geoscience Electronics, IEEE Transactions on
DOI :
10.1109/TGE.1974.294324