Title : 
Moire´ Patterns and Two-Dimensional Aliasing in Line Scanner Data Acquisition Systems
         
        
            Author : 
McGillem, C.D. ; Riemer, T.E.
         
        
            Author_Institution : 
Laboratory for Application of Remote Sensing Purdue University W. Lafayette, Indiana
         
        
        
        
        
        
        
            Abstract : 
The basic mechanism underlying the generation of Moire´ patterns in line scanner data acquisition systems is examined. A general expression is developed in terms of typical system parameters for the reproduced image of such systems and the interaction of the image spectrum; the raster frequency and digital sampling frequency of the A/D conversion process are discussed and examples given. System design requirements for avoiding Moire´ pattern generation and two-dimensional aliasing are discussed.
         
        
            Keywords : 
Aircraft; Data acquisition; Frequency conversion; Image converters; Image sampling; Low pass filters; Optical frequency conversion; Remote sensing; Signal processing; Signal sampling;
         
        
        
            Journal_Title : 
Geoscience Electronics, IEEE Transactions on
         
        
        
        
        
            DOI : 
10.1109/TGE.1974.294324