DocumentCode :
1018772
Title :
Combined Top-Down/Bottom-Up Segmentation
Author :
Borenstein, Eran ; Ullman, Shimon
Author_Institution :
Div. of Appl. Math., Brown Univ., Providence, RI
Volume :
30
Issue :
12
fYear :
2008
Firstpage :
2109
Lastpage :
2125
Abstract :
We construct a segmentation scheme that combines top-down with bottom-up processing. In the proposed scheme, segmentation and recognition are intertwined rather than proceeding in a serial manner. The top-down part applies stored knowledge about object shapes acquired through learning, whereas the bottom-up part creates a hierarchy of segmented regions based on uniformity criteria. Beginning with unsegmented training examples of class and non-class images, the algorithm constructs a bank of class-specific fragments and determines their figure-ground segmentation. This bank is then used to segment novel images in a top-down manner: the fragments are first used to recognize images containing class objects, and then to create a complete cover that best approximates these objects. The resulting segmentation is then integrated with bottom-up multi-scale grouping to better delineate the object boundaries. Our experiments, applied to a large set of four classes (horses, pedestrians, cars, faces), demonstrate segmentation results that surpass those achieved by previous top-down or bottom-up schemes. The main novel aspects of this work are the fragment learning phase, which efficiently learns the figure-ground labeling of segmentation fragments, even in training sets with high object and background variability; combining the top-down segmentation with bottom-up criteria to draw on their relative merits; and the use of segmentation to improve recognition.
Keywords :
edge detection; image segmentation; learning (artificial intelligence); object recognition; bottom-up multiscale grouping; bottom-up segmentation; class-specific fragments; figure-ground segmentation; fragment learning phase; image recognition; object shapes; top-down segmentation; Perceptual reasoning; Vision and Scene Understanding; Algorithms; Artificial Intelligence; Image Enhancement; Image Interpretation, Computer-Assisted; Pattern Recognition, Automated; Reproducibility of Results; Sensitivity and Specificity; Subtraction Technique;
fLanguage :
English
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher :
ieee
ISSN :
0162-8828
Type :
jour
DOI :
10.1109/TPAMI.2007.70840
Filename :
4408584
Link To Document :
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