Title :
Explicit solution of calibration equations for a dual 6-port network analyser
Author_Institution :
University of Surrey, Sub-Department Chemical Physics, Guildford, UK
Abstract :
Application of the 6-port reflectometer for the measurement of complex reflection coefficient, without the direct measurement of phase, is extended to a dual 6-port system for the characterisation of 2-port networks in terms of S-parameters. The system is self-calibrating and no additional standards are needed if the two reflectometers are first calibrated individually by measurements referred to calculated standards of impedance.
Keywords :
S-parameters; calibration; microwave reflectometry; network analysers; 2-port networks; S-parameters; calibration equations; complex reflection coefficient; dual 6-port network analyser; reflectometers;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19790511