DocumentCode :
1018797
Title :
Explicit solution of calibration equations for a dual 6-port network analyser
Author :
Woods, Don
Author_Institution :
University of Surrey, Sub-Department Chemical Physics, Guildford, UK
Volume :
15
Issue :
22
fYear :
1979
Firstpage :
718
Lastpage :
720
Abstract :
Application of the 6-port reflectometer for the measurement of complex reflection coefficient, without the direct measurement of phase, is extended to a dual 6-port system for the characterisation of 2-port networks in terms of S-parameters. The system is self-calibrating and no additional standards are needed if the two reflectometers are first calibrated individually by measurements referred to calculated standards of impedance.
Keywords :
S-parameters; calibration; microwave reflectometry; network analysers; 2-port networks; S-parameters; calibration equations; complex reflection coefficient; dual 6-port network analyser; reflectometers;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19790511
Filename :
4256134
Link To Document :
بازگشت