DocumentCode :
1018956
Title :
Film structure and magnetic properties of CoNiCr/Cr sputtered thin film
Author :
Ishikawa, M. ; Tani, N. ; Yamada, T. ; Ota, Y. ; Nakamura, K. ; Itoh, A.
Author_Institution :
ULVAC Corporation, Chiba, Japan
Volume :
22
Issue :
5
fYear :
1986
fDate :
9/1/1986 12:00:00 AM
Firstpage :
573
Lastpage :
575
Abstract :
The origin of the high coercive force of sputtered CoNiCr/Cr film was studied and it has been shown that the CoNiCr/Cr film has a fine grain structure with magneto-crystalline anisotropy oriented in the plane, which results in a high coercive force in the film plane. The addition of Ni to Co magnetic layer increases both the magneto-crystalline anisotropy and the coercive force. From the temperature dependence of the saturation magnetization, on depositing the Cr contained alloy films by sputtering, Cr segregates near the grain boundaries and enhances the magnetic isolation of grains, which increases the coercive force.
Keywords :
Coercive forces; Magnetic disk recording; Anisotropic magnetoresistance; Chromium; Coercive force; Magnetic anisotropy; Magnetic films; Magnetic properties; Perpendicular magnetic anisotropy; Saturation magnetization; Sputtering; Temperature dependence;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.1986.1064562
Filename :
1064562
Link To Document :
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