DocumentCode
1018956
Title
Film structure and magnetic properties of CoNiCr/Cr sputtered thin film
Author
Ishikawa, M. ; Tani, N. ; Yamada, T. ; Ota, Y. ; Nakamura, K. ; Itoh, A.
Author_Institution
ULVAC Corporation, Chiba, Japan
Volume
22
Issue
5
fYear
1986
fDate
9/1/1986 12:00:00 AM
Firstpage
573
Lastpage
575
Abstract
The origin of the high coercive force of sputtered CoNiCr/Cr film was studied and it has been shown that the CoNiCr/Cr film has a fine grain structure with magneto-crystalline anisotropy oriented in the plane, which results in a high coercive force in the film plane. The addition of Ni to Co magnetic layer increases both the magneto-crystalline anisotropy and the coercive force. From the temperature dependence of the saturation magnetization, on depositing the Cr contained alloy films by sputtering, Cr segregates near the grain boundaries and enhances the magnetic isolation of grains, which increases the coercive force.
Keywords
Coercive forces; Magnetic disk recording; Anisotropic magnetoresistance; Chromium; Coercive force; Magnetic anisotropy; Magnetic films; Magnetic properties; Perpendicular magnetic anisotropy; Saturation magnetization; Sputtering; Temperature dependence;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.1986.1064562
Filename
1064562
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