• DocumentCode
    1018956
  • Title

    Film structure and magnetic properties of CoNiCr/Cr sputtered thin film

  • Author

    Ishikawa, M. ; Tani, N. ; Yamada, T. ; Ota, Y. ; Nakamura, K. ; Itoh, A.

  • Author_Institution
    ULVAC Corporation, Chiba, Japan
  • Volume
    22
  • Issue
    5
  • fYear
    1986
  • fDate
    9/1/1986 12:00:00 AM
  • Firstpage
    573
  • Lastpage
    575
  • Abstract
    The origin of the high coercive force of sputtered CoNiCr/Cr film was studied and it has been shown that the CoNiCr/Cr film has a fine grain structure with magneto-crystalline anisotropy oriented in the plane, which results in a high coercive force in the film plane. The addition of Ni to Co magnetic layer increases both the magneto-crystalline anisotropy and the coercive force. From the temperature dependence of the saturation magnetization, on depositing the Cr contained alloy films by sputtering, Cr segregates near the grain boundaries and enhances the magnetic isolation of grains, which increases the coercive force.
  • Keywords
    Coercive forces; Magnetic disk recording; Anisotropic magnetoresistance; Chromium; Coercive force; Magnetic anisotropy; Magnetic films; Magnetic properties; Perpendicular magnetic anisotropy; Saturation magnetization; Sputtering; Temperature dependence;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1986.1064562
  • Filename
    1064562