DocumentCode :
1019082
Title :
A CMOS photodiode array with in-pixel data acquisition system for computed tomography
Author :
Steadman, Roger ; Serrano, Francisco Morales ; Vogtmeier, Gereon ; Kemna, Armin ; Oezkan, Erol ; Brockherde, Werner ; Hosticka, Bedrich J.
Author_Institution :
Philips Res. Labs., Aachen, Germany
Volume :
39
Issue :
7
fYear :
2004
fDate :
7/1/2004 12:00:00 AM
Firstpage :
1034
Lastpage :
1043
Abstract :
A CMOS photodetector array with in-pixel electronics has been developed for computed tomography (CT) applications. Current CT detectors are based on two discrete components: a photodiode array and a data acquisition system (amplifier). Both elements have to fulfill a series of severe requirements. CT scanners are moving toward larger detectors and higher speed, and yet lowering costs and improving performance. This contribution relates to the integration of both elements into a standard CMOS process to fulfill future CT scanner specifications and for a cost-effective solution. A series of limitations have been overcome to integrate both the photodiode and a charge-sensing amplifier at pixel level. In order to balance the limited responsivity of standard CMOS photodiodes, a new low-capacitance device has been devised so that low-noise design is possible while providing enough gain in the amplifier. Since a good geometric detective quantum efficiency is desired (>60%), the available area for electronics is very limited. In order to achieve a necessary dynamic range of 17 bits in such reduced area, a single-stage amplifier with automatic gain-switching has been devised. Consisting of a 10×20 pixel array, in-pixel electronics has been designed to achieve a quantum limited system under CT operating conditions.
Keywords :
CMOS integrated circuits; amplifiers; computerised tomography; data acquisition; photodetectors; photodiodes; 10 pixels; 20 pixels; 200 pixels; CMOS imager; CMOS photodiode array; CT detectors; CT scanners; amplifier gain; automatic gain-switching; charge-sensing amplifier; computed tomography; dynamic range; geometric detective quantum efficiency; in-pixel data acquisition system; in-pixel electronics; low-capacitance device; low-noise design; monolithic integration; multislice CT; pixel level; reduced area design; single-stage amplifier; x-ray beam; CMOS process; Computed tomography; Costs; Data acquisition; Detectors; Dynamic range; Low-noise amplifiers; Photodetectors; Photodiodes; Sensor arrays; CMOS imager; CT; X-ray; computed tomography; monolithic integration; multislice CT; noise; photodiode;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2004.829932
Filename :
1308577
Link To Document :
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