DocumentCode :
1019162
Title :
Predicting transistor storage time for nonstep, quasi-voltage inputs
Author :
Nanavati, R.P. ; Wilfinger, R.J.
Author_Institution :
Syracuse University, Syracuse, N. Y.
Volume :
9
Issue :
6
fYear :
1962
Firstpage :
492
Lastpage :
499
Abstract :
The differential equation which has been derived by earlier workers for minority carrier storage in the base of a one-dimensional transistor model has been solved for storage time assuming a general, time dependent, OFF base current. Specific base currents treated include those encountered when driving the base with a step, ramp, or exponential voltage in series with a speed-up network. The theoretical results are compared with the storage time observed for germanium mesa, MADT,d PADT, and epitaxial transistors in the common emitter configuration. Although the solution obtained assumes minority carriers are stored predominately in the base, the agreement between theory and observed results for mesa units, which have carrier storage in the collector also, is good.
Keywords :
Business communication; Charge carrier density; Delay; Delay effects; Differential equations; Electron devices; Frequency dependence; Germanium; Reliability theory; Switching circuits; Trademarks; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IRE Transactions on
Publisher :
ieee
ISSN :
0096-2430
Type :
jour
DOI :
10.1109/T-ED.1962.15025
Filename :
1473253
Link To Document :
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