• DocumentCode
    1019162
  • Title

    Predicting transistor storage time for nonstep, quasi-voltage inputs

  • Author

    Nanavati, R.P. ; Wilfinger, R.J.

  • Author_Institution
    Syracuse University, Syracuse, N. Y.
  • Volume
    9
  • Issue
    6
  • fYear
    1962
  • Firstpage
    492
  • Lastpage
    499
  • Abstract
    The differential equation which has been derived by earlier workers for minority carrier storage in the base of a one-dimensional transistor model has been solved for storage time assuming a general, time dependent, OFF base current. Specific base currents treated include those encountered when driving the base with a step, ramp, or exponential voltage in series with a speed-up network. The theoretical results are compared with the storage time observed for germanium mesa, MADT,d PADT, and epitaxial transistors in the common emitter configuration. Although the solution obtained assumes minority carriers are stored predominately in the base, the agreement between theory and observed results for mesa units, which have carrier storage in the collector also, is good.
  • Keywords
    Business communication; Charge carrier density; Delay; Delay effects; Differential equations; Electron devices; Frequency dependence; Germanium; Reliability theory; Switching circuits; Trademarks; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IRE Transactions on
  • Publisher
    ieee
  • ISSN
    0096-2430
  • Type

    jour

  • DOI
    10.1109/T-ED.1962.15025
  • Filename
    1473253