DocumentCode
1019244
Title
Sputter parameters and magnetic properties of permalloy for thin film heads
Author
Krusch, K.
Author_Institution
Siemens AG, St. Martin-Str, München FRG
Volume
22
Issue
5
fYear
1986
fDate
9/1/1986 12:00:00 AM
Firstpage
626
Lastpage
628
Abstract
The sputter parameters of Permalloy for the magnetic poles of thin film heads are optimized. The experiments are carried out in a standard RF diode system with RF bias. Argon nitrogen mixtures are used as sputter gas. The anisotropy field strength Hk keeps relatively constant for all parameter variations, whereas the coercivity drops when the nitrogen content of the sputter gas is raised from 0 % to more than 1 %. The saturation magnetostriction λs is very sensitive on the target composition. Changing from 76.6 to 82.4 wt % Ni causes a λs variation from +5×10-6to -2.5×10-6. Higher bias voltages result in more negative λs values. Additionally λs can be controlled over a relatively wide range (about 1.6×10-6) by the nitrogen content (0-5 %) of the sputter gas. About 1.3 wt % in composition of the target can be compensated by this nitrogen doping. X-ray investigations show that the different values are caused by composition variations in the film. Depending on whether /λs /< 1×10-6or /λs / > 1×10-6mainly two different types of domain structures were observed on patterned pole structures.
Keywords
Magnetic recording/reading heads; Permalloy films/devices; Magnetic anisotropy; Magnetic films; Magnetic heads; Magnetic properties; Magnetostriction; Nitrogen; Perpendicular magnetic anisotropy; Radio frequency; Saturation magnetization; Sputtering;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.1986.1064586
Filename
1064586
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