• DocumentCode
    1019244
  • Title

    Sputter parameters and magnetic properties of permalloy for thin film heads

  • Author

    Krusch, K.

  • Author_Institution
    Siemens AG, St. Martin-Str, München FRG
  • Volume
    22
  • Issue
    5
  • fYear
    1986
  • fDate
    9/1/1986 12:00:00 AM
  • Firstpage
    626
  • Lastpage
    628
  • Abstract
    The sputter parameters of Permalloy for the magnetic poles of thin film heads are optimized. The experiments are carried out in a standard RF diode system with RF bias. Argon nitrogen mixtures are used as sputter gas. The anisotropy field strength Hkkeeps relatively constant for all parameter variations, whereas the coercivity drops when the nitrogen content of the sputter gas is raised from 0 % to more than 1 %. The saturation magnetostriction λsis very sensitive on the target composition. Changing from 76.6 to 82.4 wt % Ni causes a λsvariation from +5×10-6to -2.5×10-6. Higher bias voltages result in more negative λsvalues. Additionally λscan be controlled over a relatively wide range (about 1.6×10-6) by the nitrogen content (0-5 %) of the sputter gas. About 1.3 wt % in composition of the target can be compensated by this nitrogen doping. X-ray investigations show that the different values are caused by composition variations in the film. Depending on whether /λs/< 1×10-6or /λs/ > 1×10-6mainly two different types of domain structures were observed on patterned pole structures.
  • Keywords
    Magnetic recording/reading heads; Permalloy films/devices; Magnetic anisotropy; Magnetic films; Magnetic heads; Magnetic properties; Magnetostriction; Nitrogen; Perpendicular magnetic anisotropy; Radio frequency; Saturation magnetization; Sputtering;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1986.1064586
  • Filename
    1064586