مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

1019358

Title :

Thermal instability in power transistors

Author :

Shockley, W.

Volume :

Issue :

fYear :

1962

Firstpage :

506

Lastpage :

506

Keywords :

Aging; Aluminum; Bonding; Electrons; Gold; Grain boundaries; Laboratories; Lead compounds; Magnetic field measurement; Magnetic switching; Power transistors; Switches; Telephony; Wire;

fLanguage :

English

Journal_Title :

Electron Devices, IRE Transactions on

Publisher :

ieee

ISSN :

0096-2430

Type :

jour

DOI :

10.1109/T-ED.1962.15045

Filename :

1473273

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1019358