Title :
A new "Hot electron" triode structure with semiconductor-metal emitter
Author :
Atalla, M.M. ; Kahng, D.
Author_Institution :
Bell Telephone Laboratories, Inc., Murray Hill, N. J.
Keywords :
1f noise; Circuit noise; Electron emission; Flexible printed circuits; Fluctuations; Frequency; Hot carriers; Laboratories; Low-frequency noise; Noise generators; Noise level; Noise reduction; Semiconductor device noise; Signal to noise ratio; Surface fitting; Transconductance; Voltage;
Journal_Title :
Electron Devices, IRE Transactions on
DOI :
10.1109/T-ED.1962.15048
