DocumentCode
1019439
Title
Attenuation length measurements of hot electrons and hot holes in metal films
Author
Crowell, C.R. ; Spitzer, W.G.
Author_Institution
Bell Telephone Laboratories, Inc., Murray Hill, N. J.
Volume
9
Issue
6
fYear
1962
Firstpage
508
Lastpage
508
Keywords
Attenuation; Capacitance; Charge carrier processes; Current density; Electromagnetic scattering; Electrons; Gold; Hot carriers; Length measurement; Ohmic contacts; Silicon; Temperature; Transistors;
fLanguage
English
Journal_Title
Electron Devices, IRE Transactions on
Publisher
ieee
ISSN
0096-2430
Type
jour
DOI
10.1109/T-ED.1962.15052
Filename
1473280
Link To Document