Title :
Attenuation length measurements of hot electrons and hot holes in metal films
Author :
Crowell, C.R. ; Spitzer, W.G.
Author_Institution :
Bell Telephone Laboratories, Inc., Murray Hill, N. J.
Keywords :
Attenuation; Capacitance; Charge carrier processes; Current density; Electromagnetic scattering; Electrons; Gold; Hot carriers; Length measurement; Ohmic contacts; Silicon; Temperature; Transistors;
Journal_Title :
Electron Devices, IRE Transactions on
DOI :
10.1109/T-ED.1962.15052
