Title :
Electrode effects on aluminum oxide tunnel junctions
Author_Institution :
Westinghouse Research Laboratories
Keywords :
Aluminum oxide; Attenuation; Capacitance; Current density; Electrodes; Electromagnetic scattering; Electrons; Gold; Ohmic contacts; Particle scattering; Semiconductor films; Silicon; Temperature; Transistors;
Journal_Title :
Electron Devices, IRE Transactions on
DOI :
10.1109/T-ED.1962.15053
