Title :
Electro-optic sampling of fast electrical signals using an InGaAsP injection laser
Author :
Taylor, A.J. ; Wiesenfeld, J.M. ; Eisenstein, G. ; Tucker, R.S. ; Talman, J.R. ; Koren, U.
Author_Institution :
AT&T Bell Laboratories, Crawford Hill Laboratory, Holmdel, USA
Abstract :
We demonstrate a new electro-optic sampling system for the measurements of fast electrical waveforms at gigahertz repetition rates. The system uses a mode-locked InGaAsP injection laser as a source of sampling pulses and employs the electro-optic effect in the GaAs substrate of a microstrip line.
Keywords :
III-V semiconductors; electric variables measurement; electro-optical devices; gallium arsenide; gallium compounds; indium compounds; measurement by laser beam; semiconductor junction lasers; waveform analysis; GaAs substrate; electro-optic sampling system; fast electrical signals; microstrip line; mode-locked InGaAsP injection laser; semiconductor laser;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19860041
