DocumentCode :
1019498
Title :
Measurement of the microwave structure constant profile
Author :
Thompson, Moody C., Jr. ; Marler, F.E. ; Allen, K.C.
Author_Institution :
Institute for Telecommunication Sciences, Boulder, CO, USA
Volume :
28
Issue :
2
fYear :
1980
fDate :
3/1/1980 12:00:00 AM
Firstpage :
278
Lastpage :
280
Abstract :
Measurements of the microstructure of refractivity at 9.4 GHz were made in Colorado and Florida up to altitudes of about 29000 ft. The structure function parameter 
was calculated from these data. Examples of the resulting profiles are presented with corresponding profiles of refractivity and temperature. Values of varied from about 
to 
m-2/3. The heights of occurrence of maximum and minimum values are summarized.
was calculated from these data. Examples of the resulting profiles are presented with corresponding profiles of refractivity and temperature. Values of varied from about to m-2/3. The heights of occurrence of maximum and minimum values are summarized.Keywords :
Electromagnetic refraction; Microwave radio propagation meteorological factors; Gratings; Magnetic fields; Microwave measurements; Optical scattering; Optical surface waves; Phase distortion; Physical optics; Refractive index; Resonance; Strips;
fLanguage :
English
Journal_Title :
Antennas and Propagation, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-926X
Type :
jour
DOI :
10.1109/TAP.1980.1142314
Filename :
1142314
Link To Document :
